Process Sensors (Europe) Limited
Process Sensors

 MCT 366


For a full product spec please download our product document.

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The MCT 366 is a compact NIR gauge suited for installations within confined spaces or where the ambient temperature lies within the range 35 -60 deg C.  The gauge enclosure is constructed from corrosion resistant 304 stainless steel, and different  window materials are available dependent on the,  kelF or sapphire. 


  • Small Footprint
    With dimensions of 250 x 190 x 165mm, this gauge will fit into more confined spaces than the standard MCT 360.
  • High Temperature operation
    The configuration of the optical bench and electronics in the MCT 366 enables reliable operation without the inconvenience of coolants up to 60°C.
  • Corrosive resistant enclosure
    MCT 366 enclosure, constructed from 304 stainless steel is engineered to withstand high temperature, caustic and humid atmospheres
  • Food grade instrument
    The stainless steel enclosure and sapphire window configuration meets foodgrade specification.
  • Quick fit single cable connection
    For easy installation, and  to facilitate the removal of the sensor should the area require high pressure spray cleaning or access for maintenance work
  • Multi Constituent Measurement
    Multiple measurements; moisture, coat weight and product temperature, from a single sensor, provides useful information for better process control without incurring additional installation and maintenance costs
  • Non Contact Measurement
    Minimal cleaning and maintenance
  • Instantaneous on-line measurement
    Ensures timely corrective action through automated or manual process adjustment
  • Choice of outputs from the Operator Interface/Processor unit
    Analog, RS232/485 and/or network options.
  • Pre Calibrated for Rapid Set-Up
  • Simple and reliable operation
    Adjustments, if required, are made using a minimal number of key strokes via the Intuitive Operator Interface or Viewer PC software
  • Measurement Confidence
    Robust measurement algorithms combined with dual beam single detector technology result in stolid measurement performance
Sensori di processo Italia China